Scanning Probe Microscopy: Atomic Force Microsc... 🏆 🎯

The tip hovers just above the surface, oscillating at its resonance frequency. It detects attractive forces without touching the sample, making it ideal for the most fragile specimens.

AFM’s ability to work in various environments—including air, vacuum, and liquids—has led to breakthroughs in several fields: Scanning Probe Microscopy: Atomic Force Microsc...

AFM can be operated in several modes depending on the delicacy of the sample and the information required: The tip hovers just above the surface, oscillating

The tip is dragged directly across the surface. While it provides high-resolution data for hard materials, the frictional forces can damage soft biological samples. While it provides high-resolution data for hard materials,

Atomic force microscope (AFM), the key tool for surface analysis

To translate this physical bending into data, a laser beam is reflected off the back of the cantilever onto a . Even minute movements of the tip shift the laser’s path, which the detector records to generate a precise 3D topographic map of the surface. Primary Imaging Modes

The cantilever oscillates and "taps" the surface rapidly. This reduces friction and lateral forces, making it the standard for imaging polymers and biological molecules like DNA. Diverse Applications across Sciences